 |
0 索取号:F123.16-53/20092 作者:韩康、 出版社:北京 : 经济科学出版社, 2008
|  |
0 索取号:K826.11=7/20095 作者:刘培杰、 出版社:哈尔滨 : 哈尔滨工业大学出版社, 2008
|
 |
0 索取号:TN304.1-53/E901/1989 作者:Symposium B on Science and Technology of Defects in Silicon (1989 : Strasbourg、 France)、Ammerlaan、 C. A. J. (Cornelis Antonius Josephus)、Chantre、 A.、Wagner、 P.、European Materials Research Society. Meeting (1989 : Strasbourg、 France)、 出版社:Amsterdam ; New York : North-Holland ; New York, NY, USA : Sole distributors for the USA and Canada, Elsevier Science Pub. Co., 1989.
|  |
0 索取号:F426.6/20093 作者:孙林岩、何哲、李刚、 出版社:北京 : 清华大学出版社, 2008
|
 |
0 索取号:TM131-53/E804/15 作者:Midwest Symposium on Circuit Theory (15th : 1972 : University of Missouri at Rolla)、IEEE Circuit Theory Group、IEEE Control Systems Society、University of Missouri at Rolla. Dept. of Electrical Engineering、 出版社:Rolla, Mo. : Dept. of Electrical Engineering, University of Missouri-Rolla, 1972
|  |
0 索取号:TN304.1-53/E801/2 作者:International Symposium on Silicon Materials Science and Technology (2nd : 1973 : Chicago、 Ill.)、Huff、 Howard R.、Burgess、 Ronald R.、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、 出版社:Princeton, N.J. : Electrochemical Society, c1973.
|
 |
0 索取号:TN91-53/E905/1992.1 作者:IEEE Global Telecommunications Conference (1992 : Orlando、 Fla.)、IEEE Communications Society.、Institute of Electrical and Electronics Engineers.、 出版社:New York : IEEE Communications Society, c1992.
|  |
0 索取号:TN91-53/E905/1992.2 作者:IEEE Global Telecommunications Conference (1992 : Orlando、 Fla.)、IEEE Communications Society.、Institute of Electrical and Electronics Engineers.、 出版社:New York : IEEE Communications Society, c1992.
|
 |
0 索取号:TN91-53/E905/1992.3 作者:IEEE Global Telecommunications Conference (1992 : Orlando、 Fla.)、IEEE Communications Society.、Institute of Electrical and Electronics Engineers.、 出版社:New York : IEEE Communications Society, c1992.
|  |
0 索取号:TN304.07-53/E801/1978 作者:Semiconductor Test Conference (1978 : Cherry Hill、 Township、 N.J.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, c1978.
|
 |
0 索取号:TN24-53/E9017 作者: 出版社:Bellingham, Wash. : SPIE-the International Society for Optical Engineering, c1983.
|  |
0 索取号:TN24-53/E9016 作者: 出版社:Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1983.
|
 |
0 索取号:TN24-53/E9015 作者: 出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1983.
|  |
0 索取号:TN24-53/E9014 作者: 出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1983.
|
 |
0 索取号:TN24-53/E9013 作者: 出版社:Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1983.
|  |
0 索取号:TN24-53/E9011 作者: 出版社:Bellingham, Wash. : SPIE - The International Society for Optical Engineering, 1982.
|